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Abstract Flexible circuit boards are a cornerstone of the modern electronics industry. In automatic defect detection, FPC connectors present challenges such as minimal differences between oxidation defects and the background, easy degradation of Intersection over Union (IoU) scores, and significant variations in the shapes of black defect boundaries. Consequently, existing algorithms perform poorly in this task. We improve model YOLOv9 by introducing Multi-scale Dilated Attention (MSDA) on the output side to enhance the ability to capture features, and Deformable Large Kernel Attention (DLKA) on the other side of the output header to improve the ability to adapt to complex defect boundaries. Our use of IoU loss completely eliminates the risk of IoU degradation or gradient vanishing. Furthermore, we reduce computational overhead with the implementation of Faster Block. Following these improvements, the mean Average Precision (mAP) at 75% IoU (mAP75) for oxidized defects increased by 7.5% relative to the base model. Similarly, the mAP at 50% IoU (mAP50) for black defects increased by 5.7%, validating the relevance and efficacy of our proposed improvements. Overall, the average mAP50, mAP75, and mAP50:95 for all defects improved by 3.8%, 2.0%, and 2.3%, respectively. The performance gain achieved by our enhanced model significantly exceeds the improvement of YOLOv9 relative to YOLOv8. |
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