| Autor: |
K. Y. You, Z. Abbas, C.Y. Lee, M. F. A. Malek, K. Y. Lee, E. M. Cheng |
| Jazyk: |
angličtina |
| Rok vydání: |
2014 |
| Předmět: |
|
| Zdroj: |
Radioengineering, Vol 23, Iss 4, Pp 1016-1025 (2014) |
| Druh dokumentu: |
article |
| ISSN: |
1210-2512 |
| Popis: |
This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1 mm – 0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to the coaxial probe. The measured reflection coefficients for the thin samples were taken with a vector network analyzer up to 7 GHz, and the calibrated reflection coefficients were converted to relative dielectric constant using an empirical reflection-coefficient model. The empirical model was created using the regression method and expressed as a polynomial model, and the coefficients of model were obtained by fitting with the data using the Finite Element Method (FEM). |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
|
