Technological cognitive diagnosis model for patent keyword analysis

Autor: Sangsung Park, Sunghae Jun
Jazyk: angličtina
Rok vydání: 2020
Předmět:
Zdroj: ICT Express, Vol 6, Iss 1, Pp 57-61 (2020)
Druh dokumentu: article
ISSN: 2405-9595
DOI: 10.1016/j.icte.2019.09.004
Popis: Patent analysis has been performed in various areas of technology management to understand technology such as research and development planning, new product development, technology innovation, sustainable technology etc. In the patent analysis, the analysis of patent keywords with technological information is very popular and meaningful. So we study on a method for patent keyword analysis, and use the cognitive diagnosis model (CDM) to construct the proposed method. We call our method technological cognitive diagnosis model (TCDM), this provides significant technology structure for understanding target technology using the result of patent keyword analysis by TCDM. We illustrate the performance of the TCDM by the experiments using the patent documents related to artificial intelligence (AI) technology. The final goal of these experiments is to find the relationship between core technologies for AI. Keywords: Patent analysis, Patent documents, Cognitive diagnosis model, Technological cognitive diagnosis model, Patent keyword analysis
Databáze: Directory of Open Access Journals