| Autor: |
Belko V.O., Emelyanov O.A., Ivanov I.O. |
| Jazyk: |
English<br />Romanian; Moldavian; Moldovan<br />Russian |
| Rok vydání: |
2017 |
| Předmět: |
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| Zdroj: |
Problems of the Regional Energetics, Vol 34, Iss 2, Pp 13-22 (2017) |
| Druh dokumentu: |
article |
| ISSN: |
1857-0070 |
| Popis: |
The advantage of modern metallized film capacitors is high reliability caused by so-called ability to self-recovery. Application of such capacitors in overload modes (at short lifetimes) can significantly improve their technical and volumetric characteristics. In spite of the fact that self-recovery had been investigated over the last decades, the existing theoretical notions and the reported experimental results did not led to the commonly accepted model of the process of self-recovery. Moreover, there is no information on film capacitors performance in overload modes in the literature. In this paper, we present the results of experimental and theoretical study on processes of self-recovery of film capacitors in overload modes. The capacitors’ testing method is proposed. The method allows to record events of self-recovery over a wide range of voltages and times. It is shown that capacitors are able to operate at voltages 4-6 times higher than nominal value. The capacitors’ degradation mechanism is caused by multiple self-recovery events that lead to the gradual accumulation of highly conducting zones near the breakdown channels. Model of single event of self-recovery is developed. This allows estimating the energy of self-recovery for different levels of applied voltage. It is suggested to use the value of cumulative energy of self-recovery as a parameter for estimating the rate of degradation and predicting the film capacitor’s lifetime. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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