| Autor: |
D M Heim, N G Pugach, M Yu Kupriyanov, E Goldobin, D Koelle, R Kleiner, N Ruppelt, M Weides, H Kohlstedt |
| Jazyk: |
angličtina |
| Rok vydání: |
2015 |
| Předmět: |
|
| Zdroj: |
New Journal of Physics, Vol 17, Iss 11, p 113022 (2015) |
| Druh dokumentu: |
article |
| ISSN: |
1367-2630 |
| DOI: |
10.1088/1367-2630/17/11/113022 |
| Popis: |
Using the Usadel approach, we provide a formalism that allows us to calculate the critical current density of 21 different types of Josephson junctions (JJs) with a ferromagnetic (F) barrier and additional insulating (I) or/and normal (N) layers inserted between the F layer and superconducting (S) electrodes. In particular, we obtain that in SFS JJs, even a thin additional N layer between the S layer and F layer may noticeably change the thickness ${d}_{{\rm{F}}}$ of the F layer at which the 0- π transitions occur. For certain values of ${d}_{{\rm{F}}},$ a 0- π transition can even be achieved by changing only the N layer thickness. We use our model to fit experimental data of SIFS and SINFS tunnel junctions. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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