Online dynamic flat-field correction for MHz microscopy data at European XFEL

Autor: Sarlota Birnsteinova, Danilo E. Ferreira de Lima, Egor Sobolev, Henry J. Kirkwood, Valerio Bellucci, Richard J. Bean, Chan Kim, Jayanath C. P. Koliyadu, Tokushi Sato, Fabio Dall'Antonia, Eleni Myrto Asimakopoulou, Zisheng Yao, Khachiwan Buakor, Yuhe Zhang, Alke Meents, Henry N. Chapman, Adrian P. Mancuso, Pablo Villanueva-Perez, Patrik Vagovič
Jazyk: angličtina
Rok vydání: 2023
Předmět:
Zdroj: Journal of Synchrotron Radiation, Vol 30, Iss 6, Pp 1030-1037 (2023)
Druh dokumentu: article
ISSN: 1600-5775
16005775
DOI: 10.1107/S1600577523007336
Popis: The high pulse intensity and repetition rate of the European X-ray Free-Electron Laser (EuXFEL) provide superior temporal resolution compared with other X-ray sources. In combination with MHz X-ray microscopy techniques, it offers a unique opportunity to achieve superior contrast and spatial resolution in applications demanding high temporal resolution. In both live visualization and offline data analysis for microscopy experiments, baseline normalization is essential for further processing steps such as phase retrieval and modal decomposition. In addition, access to normalized projections during data acquisition can play an important role in decision-making and improve the quality of the data. However, the stochastic nature of X-ray free-electron laser sources hinders the use of standard flat-field normalization methods during MHz X-ray microscopy experiments. Here, an online (i.e. near real-time) dynamic flat-field correction method based on principal component analysis of dynamically evolving flat-field images is presented. The method is used for the normalization of individual X-ray projections and has been implemented as a near real-time analysis tool at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of EuXFEL.
Databáze: Directory of Open Access Journals
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