| Autor: |
Vladyslav Andriiashen, Robert van Liere, Tristan van Leeuwen, K. Joost Batenburg |
| Jazyk: |
angličtina |
| Rok vydání: |
2023 |
| Předmět: |
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| Zdroj: |
Scientific Reports, Vol 13, Iss 1, Pp 1-11 (2023) |
| Druh dokumentu: |
article |
| ISSN: |
2045-2322 |
| DOI: |
10.1038/s41598-023-29079-w |
| Popis: |
Abstract Although X-ray imaging is used routinely in industry for high-throughput product quality control, its capability to detect internal defects has strong limitations. The main challenge stems from the superposition of multiple object features within a single X-ray view. Deep Convolutional neural networks can be trained by annotated datasets of X-ray images to detect foreign objects in real-time. However, this approach depends heavily on the availability of a large amount of data, strongly hampering the viability of industrial use with high variability between batches of products. We present a computationally efficient, CT-based approach for creating artificial single-view X-ray data based on just a few physically CT-scanned objects. By algorithmically modifying the CT-volume, a large variety of training examples is obtained. Our results show that applying the generative model to a single CT-scanned object results in image analysis accuracy that would otherwise be achieved with scans of tens of real-world samples. Our methodology leads to a strong reduction in training data needed, improved coverage of the combinations of base and foreign objects, and extensive generalizability to additional features. Once trained on just a single CT-scanned object, the resulting deep neural network can detect foreign objects in real-time with high accuracy. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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