Current tuned slotted Y‐branch laser for wafer thickness measurements with THz radiation

Autor:	N. Surkamp, A. Gerling, J. O'Gorman, M. Honsberg, S. Schmidtmann, U. Nandi, S. Preu, J. Sacher, C. Brenner, M. R. Hofmann
Jazyk:	angličtina
Rok vydání:	2021
Předmět:	Spatial variables measurement Lasing action in semiconductors Design of specific laser systems Laser beam modulation pulsing and switching mode locking and tuning Metrological applications of lasers Microwave photonics Electrical engineering. Electronics. Nuclear engineering TK1-9971
Zdroj:	Electronics Letters, Vol 57, Iss 24, Pp 936-938 (2021)
Druh dokumentu:	article
ISSN:	1350-911X 0013-5194
DOI:	10.1049/ell2.12314
Popis:	Abstract A slotted Y‐branch laser diode that emits two spectral modes at a difference frequency of about 1 THz is investigated in the context of photonic based cw‐THz measurements. The beating frequency of the emitted laser light can be tuned by ±10.5 GHz around 1 THz by changing the applied laser current, which allows for potentially fast measurements. A second spectral window of ±6.5 GHz was found at 850 GHz. Pointwise scanning of the difference frequency is demonstrated with thickness determination of HRFZ‐Si wafer samples as a possible application scenario.
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/5a05deb51aad4475956f282a093c7cad Zobrazit plný text záznamu Plný text View record in DOAJ