Autor: |
Michal Odstrcil, Mirko Holler, Jörg Raabe, Alessandro Sepe, Xiaoyuan Sheng, Silvia Vignolini, Christian G. Schroer, Manuel Guizar-Sicairos |
Jazyk: |
angličtina |
Rok vydání: |
2019 |
Předmět: |
|
Zdroj: |
Nature Communications, Vol 10, Iss 1, Pp 1-9 (2019) |
Druh dokumentu: |
article |
ISSN: |
2041-1723 |
DOI: |
10.1038/s41467-019-10670-7 |
Popis: |
Radiation induced sample deformation can be a limiting factor for X-ray imaging resolution at the nanoscale. The authors report a tomographic model that estimates and accounts for morphological changes during data acquisition and enables reconstruction of a high-resolution image ab initio. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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