X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films

Autor: L. J. Collins-McIntyre, M. D. Watson, A. A. Baker, S. L. Zhang, A. I. Coldea, S. E. Harrison, A. Pushp, A. J. Kellock, S. S. P. Parkin, G. van der Laan, T. Hesjedal
Jazyk: angličtina
Rok vydání: 2014
Předmět:
Zdroj: AIP Advances, Vol 4, Iss 12, Pp 127136-127136-11 (2014)
Druh dokumentu: article
ISSN: 2158-3226
44618433
DOI: 10.1063/1.4904900
Popis: We report the growth of Mn-doped Bi2Se3 thin films by molecular beam epitaxy (MBE), investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), SQUID magnetometry and x-ray magnetic circular dichroism (XMCD). Epitaxial films were deposited on c-plane sapphire substrates by co-evaporation. The films exhibit a spiral growth mechanism typical of this material class, as revealed by AFM. The XRD measurements demonstrate a good crystalline structure which is retained upon doping up to ∼7.5 atomic-% Mn, determined by Rutherford backscattering spectrometry (RBS), and show no evidence of the formation of parasitic phases. However an increasing interstitial incorporation of Mn is observed with increasing doping concentration. A magnetic moment of 5.1 μB/Mn is obtained from bulk-sensitive SQUID measurements, and a much lower moment of 1.6 μB/Mn from surface-sensitive XMCD. At ∼2.5 K, XMCD at the Mn L2,3 edge, reveals short-range magnetic order in the films and indicates ferromagnetic order below 1.5 K.
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