| Autor: |
Liu Haiyan, Fan Lina, Shi Wenjun, Zhou Jiajun |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
|
| Zdroj: |
Applied Mathematics and Nonlinear Sciences, Vol 9, Iss 1 (2024) |
| Druh dokumentu: |
article |
| ISSN: |
2444-8656 |
| DOI: |
10.2478/amns.2023.2.01416 |
| Popis: |
In this paper, continuous wavelet transform and discrete wavelet transform are used to detect transient anomalies entrained in normal information and to demonstrate their components. Multi-scale analysis of wavelet transform, Haar wavelet basis and multi-scale edge detection algorithms are utilized to determine the modal extreme points and identify the edge points for faster and more accurate extraction of edge features of the image. In order to further validate the applicability and feasibility of wavelet transform for printing images and to determine the quality inspection criteria based on ink penetration depth and image phase anisotropy, MATLAB software is utilized to perform simulation tests. The results show that the wavelet transform can remove the noise generated by uneven illumination and printing background during the printing process and can detect the edges of the printing image with an error accuracy of ±0.063mm and meet the error correction accuracy of |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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