A New Method for Lift-off of III-Nitride Semiconductors for Heterogeneous Integration

Autor: Zang KeYan, Cheong DavyWC, Liu HongFei, Liu Hong, Teng JingHua, Chua SooJin
Jazyk: angličtina
Rok vydání: 2010
Předmět:
Zdroj: Nanoscale Research Letters, Vol 5, Iss 6, Pp 1051-1056 (2010)
Druh dokumentu: article
ISSN: 1931-7573
1556-276X
DOI: 10.1007/s11671-010-9601-6
Popis: Abstract The release and transfer of GaN epilayers to other substrates is of interest for a variety of applications, including heterogeneous integration of silicon logic devices, III–V power devices and optical devices. We have developed a simple wet chemical etching method to release high-quality epitaxial III-nitride films from their substrates. This method builds on a nanoepitaxial lateral overgrowth (NELO) process that provides III-Nitride films with low dislocation densities. NELO is accomplished using a nanoporous mask layer patterned on GaN substrates. Chemical removal of the SiO2 layer after growth of III-Nitride overlayers causes fracture at the interface between the GaN film and the original GaN substrate, resulting in free-standing GaN films with nanostructured surfaces on one side. These layers can be transferred to other substrates, and the nano-structured surface can be used in photonic devices, or planarized for power devices.
Databáze: Directory of Open Access Journals
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