Autor: |
Omar Abdel Salam, Hisham A. Hamad, Mostafa A. R. Eltokhy, Ahmed I. Ali, Jong Yeog Son, Galal H. Ramzy |
Jazyk: |
angličtina |
Rok vydání: |
2024 |
Předmět: |
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Zdroj: |
Scientific Reports, Vol 14, Iss 1, Pp 1-17 (2024) |
Druh dokumentu: |
article |
ISSN: |
2045-2322 |
DOI: |
10.1038/s41598-024-63176-8 |
Popis: |
Abstract PMMA/PEG and PMMA/PEG doped with SiO2, TiO2, and Al2O3 were fabricated using the solution-casting technique. The composites were characterized by X-ray diffraction and scanning electron microscopy (FE-SEM), which revealed that the amorphous nature of PMMA/PEG blend doped with Al2O3 was hindered by the crystalline nature of those doped with SiO2 and TiO2. The absorption of PMMA/PEG blend doped with Al2O3 is higher, band gap energies were decreased from 4.90 eV for PMMA/PEG blend to 4.03 eV, 3.09 eV, and 2.09 eV for SiO2, TiO2, and Al2O3 doped PMMA/PEG blend, respectively. The dielectric constant, ε′ has a high value (2 × 104) for samples PMMA/PEG and SiO2/PMMA/PEG. While dielectric loss $$\left( {\varepsilon ^{{\prime \prime }} } \right)$$ ε ″ -values decreased to |
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