A model for prognosis of influence of radiation dose on value of charge carrier mobility: an analytical approach for analysis of the introduced model

Autor:	Evgeny L. Pankratov
Jazyk:	angličtina
Rok vydání:	2022
Předmět:	Radiation damage Charge carriers mobility Influence of value of radiation dose Electrical engineering. Electronics. Nuclear engineering TK1-9971 Information technology T58.5-58.64
Zdroj:	Journal of Electrical Systems and Information Technology, Vol 9, Iss 1, Pp 1-9 (2022)
Druh dokumentu:	article
ISSN:	2314-7172
DOI:	10.1186/s43067-022-00059-w
Popis:	Abstract In this paper, we analyzed the dependence of charge carriers mobility on value of radiation dose during ion implantation. Based on the considered model, we determine conditions to decrease radiation damage in the irradiated materials. Also we introduce an analytical approach to analyze mass transfer in the irradiated materials. The approach gives a possibility to take into account nonlinearity of the considered process, as well as changes of parameters of the considered process in space and time at one time.
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/56aafda7a39f492686cdc2cf17720f99 Zobrazit plný text záznamu Full text from SpringerLink View record in DOAJ