The Rapid Apple Decline Phenomenon: Current Status and Expected Associated Factors in Korea
| Autor: | Seung-Yeol Lee, Kari A. Peter, Kallol Das, Avalos-Ruiz Diane, Hee-Young Jung |
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| Jazyk: | angličtina |
| Rok vydání: | 2023 |
| Předmět: | |
| Zdroj: | The Plant Pathology Journal, Vol 39, Iss 6, Pp 538-547 (2023) |
| Druh dokumentu: | article |
| ISSN: | 1598-2254 2093-9280 |
| DOI: | 10.5423/PPJ.RW.09.2023.0132 |
| Popis: | Rapid apple decline (RAD) is a complex phenomenon affecting cultivated apple trees and particularly dwarf rootstocks on grafted young apple trees. Since its first appearance in the United States, RAD has been reported worldwide, for example in Canada, South America, Africa, and Asia. The phenomenon has also been observed in apple orchards in Korea, and it presented similar symptoms regardless of apple cultivar and cultivation period. Most previous reports have suggested that RAD may be associated with multiple factors, including plant pathogenic infections, abiotic stresses, environmental conditions, and the susceptibility of trees to cold injury during winter. However, RAD was observed to be more severe and affect more frequently apple trees on the Malling series dwarf rootstock. In this study, we reviewed the current status of RAD worldwide and surveyed biotic and abiotic factors that are potentially closely related to it in Korea. |
| Databáze: | Directory of Open Access Journals |
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