Autor: |
Ling Wang, Dongfang Zhou, Hui Tian, Hao Zhang, Wei Zhang |
Jazyk: |
angličtina |
Rok vydání: |
2019 |
Předmět: |
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Zdroj: |
Symmetry, Vol 11, Iss 2, p 228 (2019) |
Druh dokumentu: |
article |
ISSN: |
2073-8994 |
DOI: |
10.3390/sym11020228 |
Popis: |
The parametric fault diagnosis of analog circuits is very crucial for condition-based maintenance (CBM) in prognosis and health management. In order to improve the diagnostic rate of parametric faults in engineering applications, a semi-supervised machine learning algorithm was used to classify the parametric fault. A lifting wavelet transform was used to extract fault features, a local preserving mapping algorithm was adopted to optimize the Fisher linear discriminant analysis, and a semi-supervised cooperative training algorithm was utilized for fault classification. In the proposed method, the fault values were randomly selected as training samples in a range of parametric fault intervals, for both optimizing the generalization of the model and improving the fault diagnosis rate. Furthermore, after semi-supervised dimensionality reduction and semi-supervised classification were applied, the diagnosis rate was slightly higher than the existing training model by fixing the value of the analyzed component. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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