Thickness-Dependence Electrical Characterization of the One-Dimensional van der Waals TaSe3 Crystal
| Autor: | Bum Jun Kim, Byung Joo Jeong, Seungbae Oh, Sudong Chae, Kyung Hwan Choi, Tuqeer Nasir, Sang Hoon Lee, Hyung Kyu Lim, Ik Jun Choi, Min-Ki Hong, Hak Ki Yu, Jae-Hyun Lee, Jae-Young Choi |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
TaSe3
mechanical exfoliation work function van der Waals crystal scanning Kelvin probing microscopy Technology Electrical engineering. Electronics. Nuclear engineering TK1-9971 Engineering (General). Civil engineering (General) TA1-2040 Microscopy QH201-278.5 Descriptive and experimental mechanics QC120-168.85 |
| Zdroj: | Materials, Vol 12, Iss 15, p 2462 (2019) |
| Druh dokumentu: | article |
| ISSN: | 1996-1944 |
| DOI: | 10.3390/ma12152462 |
| Popis: | Needle-like single crystalline wires of TaSe3 were massively synthesized using the chemical vapor transport method. Since the wedged-shaped single TaSe3 molecular chains were stacked along the b-axis by weak van der Waals interactions, a few layers of TaSe3 flakes could be easily isolated using a typical mechanical exfoliation method. The exfoliated TaSe3 flakes had an anisotropic planar structure, and the number of layers could be controlled by a repeated peeling process until a monolayer of TaSe3 nanoribbon was obtained. Through atomic force and scanning Kelvin probe microscope analyses, it was found that the variation in the work function with the thickness of the TaSe3 flakes was due to the interlayer screening effect. We believe that our results will not only help to add a novel quasi-1D block for nanoelectronics devices based on 2D van der Waals heterostructures, but also provide crucial information for designing proper contacts in device architecture. |
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