| Autor: |
Zaikov V. P., Kinshova L. A., Moiseev V. F., Efremov V. I., Melnik Yu. V. |
| Jazyk: |
English<br />Russian |
| Rok vydání: |
2008 |
| Předmět: |
|
| Zdroj: |
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 2, Pp 45-47 (2008) |
| Druh dokumentu: |
article |
| ISSN: |
2225-5818 |
| Popis: |
A comparative analysis of TCD reliability has been carried out for different current modes. The paper presents relations allowing to determine the relative value of the operating current at a predetermined temperature difference, which provides the minimum failure rate. The possibility of predicting the reliability of devices at the design stage is shown. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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