| Autor: |
A. Bridger, W. I. F. David, T. J. Wood, M. Danaie, K. T. Butler |
| Jazyk: |
angličtina |
| Rok vydání: |
2023 |
| Předmět: |
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| Zdroj: |
npj Computational Materials, Vol 9, Iss 1, Pp 1-18 (2023) |
| Druh dokumentu: |
article |
| ISSN: |
2057-3960 |
| DOI: |
10.1038/s41524-022-00960-y |
| Popis: |
Abstract Characterisation of structure across the nanometre scale is key to bridging the gap between the local atomic environment and macro-scale and can be achieved by means of scanning electron nanobeam diffraction (SEND). As a technique, SEND allows for a broad range of samples, due to being relatively tolerant of specimen thickness with low electron dosage. This, coupled with the capacity for automation of data collection over wide areas, allows for statistically representative probing of the microstructure. This paper outlines a versatile, data-driven approach for producing domain maps, and a statistical approach for assessing their applicability. The workflow utilises a Variational AutoEncoder to identify the sources of variance in the diffraction signal, and this, in combination with clustering techniques, is used to produce domain maps. This approach is agnostic to domain crystallinity, requires no prior knowledge of crystal structure, and does not require simulation of a library of expected diffraction patterns. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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