| Autor: |
Michael Eckardt, Jan Behrends, Detlef Münter, Wolfgang Harneit |
| Jazyk: |
angličtina |
| Rok vydání: |
2015 |
| Předmět: |
|
| Zdroj: |
AIP Advances, Vol 5, Iss 4, Pp 047139-047139-13 (2015) |
| Druh dokumentu: |
article |
| ISSN: |
2158-3226 |
| DOI: |
10.1063/1.4919247 |
| Popis: |
Electrically detected magnetic resonance (EDMR) is a commonly used technique for the study of spin-dependent transport processes in semiconductor materials and electro-optical devices. Here, we present the design and implementation of a compact setup to measure EDMR, which is based on a commercially available benchtop electron paramagnetic resonance (EPR) spectrometer. The electrical detection part uses mostly off-the-shelf electrical components and is thus highly customizable. We present a characterization and calibration procedure for the instrument that allowed us to quantitatively reproduce results obtained on a silicon-based reference sample with a “large-scale” state-of-the-art instrument. This shows that EDMR can be used in novel contexts relevant for semiconductor device fabrication like clean room environments and even glove boxes. As an application example, we present data on a class of environment-sensitive objects new to EDMR, semiconducting organic microcrystals, and discuss similarities and differences to data obtained for thin-film devices of the same molecule. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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