| Autor: |
Yue Tian, Guangtai Lu, Shaoqing Du, Kazuyuki Kuroyama, Kazuhiko Hirakawa |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
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| Zdroj: |
Applied Physics Express, Vol 17, Iss 7, p 075002 (2024) |
| Druh dokumentu: |
article |
| ISSN: |
1882-0786 |
| DOI: |
10.35848/1882-0786/ad61ba |
| Popis: |
We have developed a theory for electromigration at metal nanocontacts. In the proposed theory, a metal atom is removed by kinetic energy transfer from a “lucky electron” that ballistically traverses a metal nanocontact, when the applied voltage exceeds the surface self-diffusion potential of the metal. The histogram of the critical voltage, V _c , at which metal atoms are removed, depends on the temperature as well as the probability for an atom being removed by collision with a lucky electron. The histograms of V _c for Au, Ni, Pd are well explained by the present theory. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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