Modeling noncontact atomic force microscopy resolution on corrugated surfaces
| Autor: | Kristen M. Burson, Mahito Yamamoto, William G. Cullen |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2012 |
| Předmět: | |
| Zdroj: | Beilstein Journal of Nanotechnology, Vol 3, Iss 1, Pp 230-237 (2012) |
| Druh dokumentu: | article |
| ISSN: | 2190-4286 44158866 |
| DOI: | 10.3762/bjnano.3.26 |
| Popis: | Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO2 as a specific case. We develop a quasi-1-D minimal model for noncontact atomic force microscopy, based on van der Waals interactions between a spherical tip and the surface, explicitly accounting for the corrugated substrate (modeled as a sinusoid). The model results show an attenuation of the topographic contours by ~30% for tip distances within 5 Å of the surface. Results also indicate a deviation from the Hamaker force law for a sphere interacting with a flat surface. |
| Databáze: | Directory of Open Access Journals |
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