Customized MFM probes with high lateral resolution

Autor: Óscar Iglesias-Freire, Miriam Jaafar, Eider Berganza, Agustina Asenjo
Jazyk: angličtina
Rok vydání: 2016
Předmět:
Zdroj: Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 1068-1074 (2016)
Druh dokumentu: article
ISSN: 2190-4286
DOI: 10.3762/bjnano.7.100
Popis: Magnetic force microscopy (MFM) is a widely used technique for magnetic imaging. Besides its advantages such as the high spatial resolution and the easy use in the characterization of relevant applied materials, the main handicaps of the technique are the lack of control over the tip stray field and poor lateral resolution when working under standard conditions. In this work, we present a convenient route to prepare high-performance MFM probes with sub-10 nm (sub-25 nm) topographic (magnetic) lateral resolution by following an easy and quick low-cost approach. This allows one to not only customize the tip stray field, avoiding tip-induced changes in the sample magnetization, but also to optimize MFM imaging in vacuum (or liquid media) by choosing tips mounted on hard (or soft) cantilevers, a technology that is currently not available on the market.
Databáze: Directory of Open Access Journals