Defect Recognition and Morphology Operation in Binary Images Using Line-Scanning-Based Induction Thermography

Autor: Seungju Lee, Yoonjae Chung, Wontae Kim
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: Applied Sciences, Vol 12, Iss 12, p 6006 (2022)
Druh dokumentu: article
ISSN: 2076-3417
DOI: 10.3390/app12126006
Popis: Active infrared thermography is an attractive and highly reliable technique used for the non-destructive evaluation of test objects. In this paper, defect detection on the subsurface of the STS304 metal specimen was performed by applying the line-scanning method to induction thermography. In general, the infrared camera and the specimen are fixed in induction thermography, but the line-scanning method can excite a uniform heat source because relative movement occurs. After that, the local heating area due to Joule’s heating effect was removed, and filtering was applied for the 1st de-noising. Threshold-value-based binarization processing using the Otsu algorithm was performed for clear defect object recognition. After performing the 2nd de-noising, automatic defect recognition was performed using a boundary tracking algorithm. As a result, the conditions due to the parameters of the scanning line for the thermal image were determined.
Databáze: Directory of Open Access Journals