Characterization of nanostructured ZnO thin films deposited through vacuum evaporation

Autor: Jose Alberto Alvarado, Arturo Maldonado, Héctor Juarez, Mauricio Pacio, Rene Perez
Jazyk: angličtina
Rok vydání: 2015
Předmět:
Zdroj: Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 971-975 (2015)
Druh dokumentu: article
ISSN: 2190-4286
DOI: 10.3762/bjnano.6.100
Popis: This work presents a novel technique to deposit ZnO thin films through a metal vacuum evaporation technique using colloidal nanoparticles (average size of 30 nm), which were synthesized by our research group, as source. These thin films had a thickness between 45 and 123 nm as measured by profilometry. XRD patterns of the deposited thin films were obtained. According to the HRSEM micrographs worm-shaped nanostructures are observed in samples annealed at 600 °C and this characteristic disappears as the annealing temperature increases. The films obtained were annealed from 25 to 1000 °C, showing a gradual increase in transmittance spectra up to 85%. The optical band gaps obtained for these films are about 3.22 eV. The PL measurement shows an emission in the red and in the violet region and there is a correlation with the annealing process.
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