| Autor: |
Fitaev Ibraim Shevketovich, Orlenson Vulf Borisrvich, Romanets Yuri Viktorovich, Mazinov Alim Seit-Ametovich |
| Jazyk: |
angličtina |
| Rok vydání: |
2019 |
| Předmět: |
|
| Zdroj: |
ITM Web of Conferences, Vol 30, p 08013 (2019) |
| Druh dokumentu: |
article |
| ISSN: |
2271-2097 |
| DOI: |
10.1051/itmconf/20193008013 |
| Popis: |
The paper presents experimental and theoretical results on the surface topography of thin aluminum films. The ambiguous topology dynamics of the thin-film structure is represented as a function of the increase in the bulk mass of the deposited material, which leads to an occasional rise in roughness reaching its maximum at a film thickness of 7 nm. At same time on the same thickness of the conductive layer the maximum of the absorption coefficient variability is observed. A theoretical analysis of the optical coefficients depending on the size of the conductive film substantiated the existence of extremes, but at smaller thicknesses. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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