Fabrication and characterization of porous silicon for photonic applications

Autor: Arvin I. Mabilangan, Niel Gabriel E. Saplagio, Eloise P. Anguluan, Neil Irvin F. Cabello, Rhona Olivia M. Gonzales, Armando S. Somintac, Arnel A. Salvador
Jazyk: angličtina
Rok vydání: 2013
Předmět:
Zdroj: Science Diliman, Vol 25, Iss 1, Pp 16-26 (2013)
Druh dokumentu: article
ISSN: 0115-7809
2012-0818
Popis: Porous silicon (PSi) thin films from p-type silicon (100) substrates were fabricated using a simple table top electrochemical etching setup with a 1:1 HF:EtOh electrolyte solution. Porous silicon f ilms with different morphologies and optical properties were achieved by varying the etching parameters, such as HF concentration, etching time andanodization current. It was observed that the f ilm thickness of the fabricated PSi increased with etch time and HF concentration. The etch rate increased with the applied anodization current. Reflection spectroscopy at normal incidence was used to determine the refractive indices of the fabricated f ilms. Using the Sellmeier equation, the chromatic dispersion of the f ilms was obtained for different HF concentrations and anodization currents.
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