Refractive indices of MBE-grown AlxGa(1−x)As ternary alloys in the transparent wavelength region

Autor: Konstantinos Papatryfonos, Todora Angelova, Antoine Brimont, Barry Reid, Stefan Guldin, Peter Raymond Smith, Mingchu Tang, Keshuang Li, Alwyn J. Seeds, Huiyun Liu, David R. Selviah
Jazyk: angličtina
Rok vydání: 2021
Předmět:
Zdroj: AIP Advances, Vol 11, Iss 2, Pp 025327-025327-10 (2021)
Druh dokumentu: article
ISSN: 2158-3226
DOI: 10.1063/5.0039631
Popis: A series of AlxGa(1−x)As ternary alloys were grown by molecular beam epitaxy (MBE) at the technologically relevant composition range, x < 0.45, and characterized using spectroscopic ellipsometry to provide accurate refractive index values in the wavelength region below the bandgap. Particular attention is given to O-band and C-band telecommunication wavelengths around 1.3 µm and 1.55 µm, as well as at 825 nm. MBE gave a very high accuracy for grown layer thicknesses, and the alloys’ precise compositions and bandgap values were confirmed using high-resolution x-ray diffraction and photoluminescence, to improve the refractive index model fitting accuracy. This work is the first systematic study for MBE-grown AlxGa(1−x)As across a wide spectral range. In addition, we employed a very rigorous measurement-fitting procedure, which we present in detail.
Databáze: Directory of Open Access Journals