Autor: |
A Janse van Vuuren, A Ibrayeva, R A Rymzhanov, A Zhalmagambetova, J H O’Connell, V A Skuratov, V V Uglov, S V Zlotski, A E Volkov, M Zdorovets |
Jazyk: |
angličtina |
Rok vydání: |
2020 |
Předmět: |
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Zdroj: |
Materials Research Express, Vol 7, Iss 2, p 025512 (2020) |
Druh dokumentu: |
article |
ISSN: |
2053-1591 |
DOI: |
10.1088/2053-1591/ab72d3 |
Popis: |
Parameters such as track diameter and microstruture of latent tracks in polycrystalline Si _3 N _4 induced by 710 MeV Bi ions were studied using TEM and XRD techniques, and MD simulation. Experimental results are considered in terms of the framework of a ‘core–shell’ inelastic thermal spike (i-TS) model. The average track radius determined by means of electron microscopy coincides with that deduced from computer modelling and is similar to the track core size predicted by the i-TS model using a boiling criterion. Indirect (XRD) techniques give a larger average latent track radius which is consistent with the integral nature of the signal collected from the probed volume of irradiated material. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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