| Autor: |
Ehara Takashi, Nakanishi Takayoshi |
| Jazyk: |
English<br />French |
| Rok vydání: |
2016 |
| Předmět: |
|
| Zdroj: |
MATEC Web of Conferences, Vol 67, p 04012 (2016) |
| Druh dokumentu: |
article |
| ISSN: |
2261-236X |
| DOI: |
10.1051/matecconf/20166704012 |
| Popis: |
CuAlO2 thin films are prepared by sol-gel dip-coating followed by annealing in nitrogen atmosphere using copper nitrate and aluminum nitrate as metal source materials. X-ray diffraction (XRD) patterns show (003), (006) and (009) oriented peaks of CuAlO2 at annealing temperature of 800 – 1000°C. This result indicates that the CuAlO2 films prepared in the present work are c-axis oriented. XRD peak intensity increase with annealing temperature and becomes maximum at 850°C. The CuAlO2 XRD peak decreased at annealing temperature of 900°C with appearance of a peak of CuO, and then increased again with annealing temperature until 1000 °C. The films have bandgap of 3.4 eV at annealing temperature of 850°C in which the transparency becomes the highest. At the annealing temperature of 850°C, scanning electron microscope (SEM) observation reveals that the films are consist of amorphous fraction and microcrystalline CuAlO2 fraction. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
|
