| Autor: |
D. Alonso-Álvarez, B. Alén, J. M. Ripalda, A. Rivera, A. G. Taboada, J. M. Llorens, Y. González, L. González, F. Briones |
| Jazyk: |
angličtina |
| Rok vydání: |
2013 |
| Předmět: |
|
| Zdroj: |
APL Materials, Vol 1, Iss 2, Pp 022112-022112 (2013) |
| Druh dokumentu: |
article |
| ISSN: |
2166-532X |
| DOI: |
10.1063/1.4818358 |
| Popis: |
Using the mechano-optical stress sensor technique, we observe a counter-intuitive reduction of the compressive stress when InAs is deposited on GaAs (001) during the growth of quantum posts. Through modelling of the strain fields, we find that such anomalous behaviour can be related to the strain-driven detachment of In atoms from the crystal and their surface diffusion towards the self-assembled nanostructures. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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