Autor: |
Shigenori Ueda, Masaki Mizuguchi |
Jazyk: |
angličtina |
Rok vydání: |
2024 |
Předmět: |
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Zdroj: |
Applied Physics Express, Vol 17, Iss 7, p 075501 (2024) |
Druh dokumentu: |
article |
ISSN: |
1882-0786 |
DOI: |
10.35848/1882-0786/ad5e33 |
Popis: |
Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2 p -Fe 3 d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only the bulk band but also the buried interface band of heterojunctions. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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