Probing buried interface band dispersion of a MgO/Fe heterostructure with hard X-ray angle-resolved photoemission

Autor: Shigenori Ueda, Masaki Mizuguchi
Jazyk: angličtina
Rok vydání: 2024
Předmět:
Zdroj: Applied Physics Express, Vol 17, Iss 7, p 075501 (2024)
Druh dokumentu: article
ISSN: 1882-0786
DOI: 10.35848/1882-0786/ad5e33
Popis: Interface band dispersion of a MgO(2 nm)/Fe(50 nm) heterostructure was detected by hard X-ray angle-resolved photoemission spectroscopy (HARPES) with the excitation photon energy of 3.29 keV by utilizing X-ray total reflection (TR). By subtracting bulk-sensitive band dispersion of the buried Fe(001) obtained by HARPES in the non-TR condition from near-interface-sensitive Fe(001) band dispersion obtained by TR-HARPES, the band-folding of Fe and the O 2 p -Fe 3 d hybridization at the heterointerface were clearly unveiled. These results suggest that HARPES can probe not only the bulk band but also the buried interface band of heterojunctions.
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