| Autor: |
Sangeetha Hari, Johan A. Slotman, Yoram Vos, Christian Floris, Wiggert A. van Cappellen, C. W. Hagen, Sjoerd Stallinga, Adriaan B. Houtsmuller, Jacob P. Hoogenboom |
| Jazyk: |
angličtina |
| Rok vydání: |
2022 |
| Předmět: |
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| Zdroj: |
Scientific Reports, Vol 12, Iss 1, Pp 1-10 (2022) |
| Druh dokumentu: |
article |
| ISSN: |
2045-2322 |
| DOI: |
10.1038/s41598-022-24502-0 |
| Popis: |
Abstract Super-resolution fluorescence microscopy can be achieved by image reconstruction after spatially patterned illumination or sequential photo-switching and read-out. Reconstruction algorithms and microscope performance are typically tested using simulated image data, due to a lack of strategies to pattern complex fluorescent patterns with nanoscale dimension control. Here, we report direct electron-beam patterning of fluorescence nanopatterns as calibration standards for super-resolution fluorescence. Patterned regions are identified with both electron microscopy and fluorescence labelling of choice, allowing precise correlation of predefined pattern dimensions, a posteriori obtained electron images, and reconstructed super-resolution images. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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