| Autor: |
Kazunori Hasegawa, Kanta Hara, Nobuyuki Shishido, Satoshi Nakano, Wataru Saito, Tamotsu Ninomiya |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
|
| Zdroj: |
Power Electronic Devices and Components, Vol 7, Iss , Pp 100061- (2024) |
| Druh dokumentu: |
article |
| ISSN: |
2772-3704 |
| DOI: |
10.1016/j.pedc.2024.100061 |
| Popis: |
This paper presents a power-cycling degradation monitoring method of an IGBT module with a VCE(sat) sensing circuit and junction temperature prediction by a three-dimensional structure model. A chopper circuit was introduced to provide a continuous-current-conducting operation of the IGBT module. The VCE(sat) sensing circuit with a low-cost IoT platform “Leafony” was utilized to monitor the junction temperature of an IGBT chip, which transferred the measured signal as digital data, and thus obtained a higher noise immunity than an analog-based circuit. The junction temperature of IGBT chip in the power module was analyzed from the dissipated power of IGBT and the transient thermal impedance between the chips and the ambient. This analysis is effective not only to observe the degradation but also to estimate the thermal resistance. Comparing the temperature profile between experiment and prediction provides health condition of the IGBT model.Predicted thermal profiles agreed with measured ones with 10 % increase of thermal resistance, which was degraded by a power cycle tester. From these results, the proposed monitoring method is effective to detect the progress of power cycle degradation. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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