| Autor: |
R.G. Mendes, E.B. Araújo, J.A. Eiras |
| Jazyk: |
angličtina |
| Rok vydání: |
2001 |
| Předmět: |
|
| Zdroj: |
Materials Research, Vol 4, Iss 2, Pp 113-116 (2001) |
| Druh dokumentu: |
article |
| ISSN: |
1516-1439 |
| DOI: |
10.1590/S1516-14392001000200013 |
| Popis: |
Strontium barium niobate (SBN) thin films of good quality were deposited on Pt/Ti/SiO2/Si substrate using a polymeric resin containing metallic ions. Films were crystallized at different temperatures and for different duration of time. The structure of these films was studied using X-ray diffraction. The coexistence of SrNb2O6 (SN) and SBN was observed in films crystallized at 700 °C. The amount of SN decreases when the crystallization time increases. Ferroelectric properties were determined for films crystallized at 700 °C for 1 and 5 h. For SBN film crystallized at 700 °C for 1 h, the remanent polarization (Pr) and the coercive field (Ec) were 2.6 muC/cm² and 71.9 kV/cm, respectively. For the film crystallized at 700 °C for 5 h these parameters were Pr = 1.1 muC/cm² and Ec = 50.5 kV/cm. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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