| Autor: |
M-S Kim, A C Assafrao, T Scharf, A J H Wachters, S F Pereira, H P Urbach, M Brun, S Olivier, S Nicoletti, H P Herzig |
| Jazyk: |
angličtina |
| Rok vydání: |
2012 |
| Předmět: |
|
| Zdroj: |
New Journal of Physics, Vol 14, Iss 10, p 103024 (2012) |
| Druh dokumentu: |
article |
| ISSN: |
1367-2630 |
| DOI: |
10.1088/1367-2630/14/10/103024 |
| Popis: |
We report on the experimental and numerical demonstration of immersed submicron-size hollow focused spots, generated by structuring the polarization state of an incident light beam impinging on a micro-size solid immersion lens ( μ -SIL) made of SiO _2 . Such structured focal spots are characterized by a doughnut-shaped intensity distribution, whose central dark region is of great interest for optical trapping of nano-size particles, super-resolution microscopy and lithography. In this work, we have used a high-resolution interference microscopy technique to measure the structured immersed focal spots, whose dimensions were found to be significantly reduced due to the immersion effect of the μ -SIL. In particular, a reduction of 37% of the dark central region was verified. The measurements were compared with a rigorous finite element method model for the μ -SIL, revealing excellent agreement between them. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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