| Autor: |
Martin Jaegle, Hans-Fridtjof Pernau, Marcus Pfützner, Mike Benkendorf, Xinke Li, Markus Bartel, Susanne Drost, Jürgen Wöllenstein |
| Jazyk: |
angličtina |
| Rok vydání: |
2018 |
| Předmět: |
|
| Zdroj: |
Proceedings, Vol 2, Iss 13, p 1053 (2018) |
| Druh dokumentu: |
article |
| ISSN: |
2504-3900 |
| DOI: |
10.3390/proceedings2131053 |
| Popis: |
Electrical impedance spectroscopy is a widespread characterization method for solids or fluids in industrial applications. We here report on its thermal equivalent, the “thermal impedance spectroscopy”, improved by using a temperature compensation method for temperature dependent thermal measurements using an on-chip reference resistor. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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