Thermal Analysis of FIMS TDC and LVPS Electronic Boards
| Autor: | K.-I. Seon, I.-S. Yuk, U.-W. Nam, H. Jin, J.-H. Park, J.-G. Rhee, K.-S. Ryu, D.-H. Lee, H.-S. Oh, K.-K. Kong, W. Han, K.-W. Min, J. Edelstein, E. Korpela |
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| Jazyk: | angličtina |
| Rok vydání: | 2002 |
| Předmět: | |
| Zdroj: | Journal of Astronomy and Space Sciences, Vol 19, Iss 4, Pp 283-292 (2002) |
| Druh dokumentu: | article |
| ISSN: | 2093-5587 2093-1409 |
| DOI: | 10.5140/JASS.2002.19.4.283 |
| Popis: | Electronic boards of Far-ultraviolet IMaging Spectrograph (FIMS) should be designed to maintain their performances, and their temperatures should be remained within the allowed temperatures in operational environments. Thermal analysis at the electronic board level has been performed, and it is confirmed the electronics parts could be kept within their allowed temperature ranges. |
| Databáze: | Directory of Open Access Journals |
| Externí odkaz: |
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