| Autor: |
Kindler Birgit, Celik Ayik Elif, Hübner Annett, Lommel Bettina, Steiner Jutta, Yakusheva Vera |
| Jazyk: |
angličtina |
| Rok vydání: |
2020 |
| Předmět: |
|
| Zdroj: |
EPJ Web of Conferences, Vol 229, p 02002 (2020) |
| Druh dokumentu: |
article |
| ISSN: |
2100-014X |
| DOI: |
10.1051/epjconf/202022902002 |
| Popis: |
For characterization of targets and foils prepared at the target laboratory as well as for characterization of e.g. degrader or windows of internal customers, different analytical devices are available. Besides a lot of standard equipment, the target laboratory of GSI holds a 3D-measurement system (MicroProf®) equipped with optical sensors for measuring surface parameters as well as total thickness variations contact-free. In the paper the measuring principle including the possibilities and features of the MicroProf®-system are explained and some different applications are shown. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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