| Autor: |
LUO Jun, LI Nan, WANG Xi, LIU Changkui |
| Jazyk: |
čínština |
| Rok vydání: |
2024 |
| Předmět: |
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| Zdroj: |
Cailiao gongcheng, Vol 52, Iss 7, Pp 120-129 (2024) |
| Druh dokumentu: |
article |
| ISSN: |
1001-4381 |
| DOI: |
10.11868/j.issn.1001-4381.2023.000752 |
| Popis: |
Residual stress runs through the whole life cycle of materials and components，including design， production， processing， manufacturing， service and failure， and is a key factor affecting the processing accuracy， dimensional stability and fatigue strength of materials and components. It is important to know how to accurately and non-destructively characterize residual stresses. Compared with the traditional laboratory X-ray diffraction method， synchrotron X-ray diffraction has significant advantages in brightness， collimation， time resolution， spatial resolution， penetration depth， etc. It is one of the most effective methods for non-destructive in-situ accurate characterization of residual stresses in engineering materials and key components. This paper focused on the research progress of synchrotron radiation X-ray diffraction technology in material residual stress， highlighting the analysis of residual stress in high temperature alloys during the additive manufacturing process， the effect of laser shot peening-technology on residual stress in titanium alloys， the evaluation of residual stress in welded aluminum alloys， the influence of heat treatment parameters on residual stress in structural steels， and the study of residual stress in ceramic coatings. Finally， the shortcomings of synchrotron X-ray diffraction technology in industrial applications are analyzed， and the future research and development directions are prospected， including the development of in-situ test environment and devices， and the combination of synchrotron radiation X-ray diffraction technology and other non-destructive testing methods. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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