| Autor: |
Seok-Woo Lee, Chang Bum Park, Pyo Jin Jeon, Sung-Wook Min, June Yeong Lim, Han Sol Lee, Jae-Sung Yoo, Soon Sung Yoo, Seongil Im |
| Jazyk: |
angličtina |
| Rok vydání: |
2016 |
| Předmět: |
|
| Zdroj: |
IEEE Journal of the Electron Devices Society, Vol 4, Iss 1, Pp 7-10 (2016) |
| Druh dokumentu: |
article |
| ISSN: |
2168-6734 |
| DOI: |
10.1109/JEDS.2015.2493561 |
| Popis: |
We report on an abnormal output characteristics in p-type low temperature polycrystalline silicon thin-film transistors fabricated on polyimide (PI); negative differential conductance behavior is often observed in saturation region of drain current from large width devices. To understand such abnormal output characteristics, device dimension dependence was studied in a systematic way. As a result, we found that enhanced self-heating is mainly responsible originating from the poor thermal conductivity of PI substrate. A related degradation model is also proposed. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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