Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
| Autor: | Giulio Guzzinati, Thomas Altantzis, Maria Batuk, Annick De Backer, Gunnar Lumbeeck, Vahid Samaee, Dmitry Batuk, Hosni Idrissi, Joke Hadermann, Sandra Van Aert, Dominique Schryvers, Johan Verbeeck, Sara Bals |
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| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
TEM
electron diffraction tomography STEM atom counting electron tomography compressed sensing EDS EELS nanomechanical testing ACOM TEM Technology Electrical engineering. Electronics. Nuclear engineering TK1-9971 Engineering (General). Civil engineering (General) TA1-2040 Microscopy QH201-278.5 Descriptive and experimental mechanics QC120-168.85 |
| Zdroj: | Materials, Vol 11, Iss 8, p 1304 (2018) |
| Druh dokumentu: | article |
| ISSN: | 1996-1944 |
| DOI: | 10.3390/ma11081304 |
| Popis: | The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science. |
| Databáze: | Directory of Open Access Journals |
| Externí odkaz: |
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