Noise-robust analysis of X-Ray absorption near-edge structure based on poisson distribution
| Autor: | Shuhei Kashiwamura, Shun Katakami, Taiga Yamasaki, Kazunori Iwamitsu, Hiroyuki Kumazoe, Kenji Nagata, Toshihiro Okajima, Ichiro Akai, Masato Okada |
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| Jazyk: | angličtina |
| Rok vydání: | 2024 |
| Předmět: | |
| Zdroj: | Science and Technology of Advanced Materials: Methods, Vol 4, Iss 1 (2024) |
| Druh dokumentu: | article |
| ISSN: | 27660400 2766-0400 |
| DOI: | 10.1080/27660400.2024.2397939 |
| Popis: | We demonstrate that the noise tolerance of X-ray absorption near-edge structure (XANES) analysis can be improved by reconsidering the noise model. XANES measurement is a powerful technique to investigate the structure and electronic state of materials. In XANES measurements, the incident photon number and the absorbed photon number are measured, and the ratio of the two (called the absorption factor) is analyzed. The conventional analytical method involves fitting by the least-squares method, in which the stochastic noise is assumed to conform to a Gaussian distribution. We propose a framework for XANES analysis using a Poisson distribution as a likelihood model, focusing on the number of absorbed photons rather than the absorption factor. We validate the effectiveness of our method in numerical experiments. Moreover, we apply our method to actual solid electrolyte material data and demonstrate its practicality. |
| Databáze: | Directory of Open Access Journals |
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