| Autor: |
Yongqing Zhao, Binbin Xiang, Shangmin Lin, Yang Zhang, Wei Wang |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
|
| Zdroj: |
Applied Sciences, Vol 14, Iss 12, p 5272 (2024) |
| Druh dokumentu: |
article |
| ISSN: |
2076-3417 |
| DOI: |
10.3390/app14125272 |
| Popis: |
Microwave holographic measurement technology is a common method used in antenna measurement. This method has high measurement efficiency and high precision. To evaluate and enhance the antenna’s performance, it is crucial to precisely determine the surface deformation. In this paper, the effects of feed offset error and scanning error on the antenna microwave holographic measurement results are investigated, and corresponding error compensation methods are proposed. The relationship between the influence of the error sources on the antenna gain loss and surface deformation accuracy is established. The reasons for holographic measurement errors, their characteristics, and their specific impact on system performance can be better understood. In order to improve the accuracy of the measurement, the compensation methods for the different measurement errors are given. They can provide the theoretical basis for maintaining and enhancing the performance of antenna system. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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