Autor: |
Yue Zhang, Ruida Xu, Jiangkun Hu, Wei Xu, Yuhuai He, Huichen Yu |
Jazyk: |
angličtina |
Rok vydání: |
2024 |
Předmět: |
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Zdroj: |
Journal of Materials Research and Technology, Vol 29, Iss , Pp 3522-3531 (2024) |
Druh dokumentu: |
article |
ISSN: |
2238-7854 |
DOI: |
10.1016/j.jmrt.2024.01.238 |
Popis: |
Creep rupture tests were conducted on 67 thin-walled DD6 specimens, with thicknesses ranging from 0.35 mm to 1.50 mm, at temperatures of 760 °C, 850 °C, 980 °C, and 1100 °C, revealing a log-linear relationship between rupture lifetimes and specimen thicknesses. Micro-CT observations identified an inhomogeneous distribution of creep micropores around dendrites as a contributing factor to the thickness debit effect. Based on the reliability mathematical method, a possible explanation was proposed for the parabolic law relationship between rupture times and specimen thicknesses. In addition, a thickness debit characterization parameter (TDP) was derived to quantify the trend of creep property degradation as thickness decreases. The TDP equation effectively predicted the creep rupture lifetimes of DD6 thin-walled specimens mostly within a scatter band factor of 2. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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