Ge-Sb-Te Chalcogenide Thin Films Deposited by Nanosecond, Picosecond, and Femtosecond Laser Ablation

Autor: Georgiana Bulai, Oana Pompilian, Silviu Gurlui, Petr Nemec, Virginie Nazabal, Nicanor Cimpoesu, Bertrand Chazallon, Cristian Focsa
Jazyk: angličtina
Rok vydání: 2019
Předmět:
Zdroj: Nanomaterials, Vol 9, Iss 5, p 676 (2019)
Druh dokumentu: article
ISSN: 2079-4991
DOI: 10.3390/nano9050676
Popis: Ge-Sb-Te thin films were obtained by ns-, ps-, and fs-pulsed laser deposition (PLD) in various experimental conditions. The thickness of the samples was influenced by the Nd-YAG laser wavelength, fluence, target-to-substrate distance, and deposition time. The topography and chemical analysis results showed that the films deposited by ns-PLD revealed droplets on the surface together with a decreased Te concentration and Sb over-stoichiometry. Thin films with improved surface roughness and chemical compositions close to nominal values were deposited by ps- and fs-PLD. The X-ray diffraction and Raman spectroscopy results showed that the samples obtained with ns pulses were partially crystallized while the lower fluences used in ps- and fs-PLD led to amorphous depositions. The optical parameters of the ns-PLD samples were correlated to their structural properties.
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