| Autor: |
Vladimir Polkonikov, Nikolai Chkhalo, Roman Pleshkov, Angelo Giglia, Nicolas Rividi, Emmanuelle Brackx, Karine Le Guen, Iyas Ismail, Philippe Jonnard |
| Jazyk: |
angličtina |
| Rok vydání: |
2021 |
| Předmět: |
|
| Zdroj: |
Applied Sciences, Vol 11, Iss 14, p 6385 (2021) |
| Druh dokumentu: |
article |
| ISSN: |
2076-3417 |
| DOI: |
10.3390/app11146385 |
| Popis: |
X-ray spectroscopy of lithium is very difficult, even impossible, with wavelength dispersive spectrometers commonly deployed on scanning electron microscopes or electron microprobe analyzers. This is due to the absence of crystals and lack of efficient periodic multilayer for this spectral range, around 50 eV. To address this issue, we propose using a Be/Si/Al multilayer having a period of about 29 nm. The multilayer was deposited by magnetron sputtering and its reflectivity measured as a function of the glancing angle in the spectral range of the Li K emission and as a function of the incident energy up to ~200 eV. This characterization demonstrates that the designed multilayer is suitable to efficiently perform spectroscopy in the range of the Li K emission in terms of reflectance (0.32 at 51.5 eV), bandwidth (around 3.5 eV) and rejection of high order diffracted radiation. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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