The properties of metal contacts on TiO2 thin films produced by reactive magnetron sputtering
Autor: | Brus V. V., Kovaluk Z. D., Maryanchuk P. D., Orletsky I. G., Maystruk E. V. |
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Jazyk: | English<br />Russian |
Rok vydání: | 2010 |
Předmět: | |
Zdroj: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 5-6, Pp 60-62 (2010) |
Druh dokumentu: | article |
ISSN: | 2225-5818 07274963 |
Popis: | The article deals with research on volt-ampere characteristics of metal contacts (Al, Cr, In, Mo, Ti) on titanium dioxide thin films and influence of annealing in vacuum on their electric properties. Volt-ampere characteristics measurements were taken by three-probe method. There was established that indium contact on TiO2 thin films possessed sharply defined ohmic properties. |
Databáze: | Directory of Open Access Journals |
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