The properties of metal contacts on TiO2 thin films produced by reactive magnetron sputtering

Autor: Brus V. V., Kovaluk Z. D., Maryanchuk P. D., Orletsky I. G., Maystruk E. V.
Jazyk: English<br />Russian
Rok vydání: 2010
Předmět:
Zdroj: Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 5-6, Pp 60-62 (2010)
Druh dokumentu: article
ISSN: 2225-5818
07274963
Popis: The article deals with research on volt-ampere characteristics of metal contacts (Al, Cr, In, Mo, Ti) on titanium dioxide thin films and influence of annealing in vacuum on their electric properties. Volt-ampere characteristics measurements were taken by three-probe method. There was established that indium contact on TiO2 thin films possessed sharply defined ohmic properties.
Databáze: Directory of Open Access Journals