Ultrahigh Breakdown Field in Gallium (III) Oxide Dielectric Structure Fabricated by Novel Aerosol Deposition Method

Autor: Jun‐Woo Lee, Jong Ho Won, Woosup Kim, Jwa‐Bin Jeon, Myung‐Yeon Cho, Sunghoon Kim, Minkyung Kim, Chulhwan Park, Weon Ho Shin, Kanghee Won, Sang‐Mo Koo, Jong‐Min Oh
Jazyk: angličtina
Rok vydání: 2024
Předmět:
Zdroj: Small Structures, Vol 5, Iss 12, Pp n/a-n/a (2024)
Druh dokumentu: article
ISSN: 2688-4062
DOI: 10.1002/sstr.202400321
Popis: With the increasing demand for modern high‐voltage electronic devices in electric vehicles and renewable‐energy systems, power semiconductor devices with high breakdown fields are becoming essential. β‐Gallium oxide (Ga2O3), which has a theoretical breakdown field of 8 MV cm−1, is being studied as a next‐generation power‐switch material. However, realizing a breakdown field close to this theoretical value remains challenging. In this study, an aerosol deposition‐manufactured Ga2O3 film boasting an extremely high breakdown field, achieved through thickness optimization, heat treatment, and a unique nozzle‐tilting method, is developed. This study explores the effect of oxygen vacancies on the dielectric constant, breakdown field, and microstructure of Ga2O3 films. Through these methods, Ga2O3 films with a denser (98.88%) and uniform surface, made less affected by oxygen vacancies through nozzle tilting and post‐annealing at 800 °C, are produced, resulting in appropriate dielectric constants (9.3 at 10 kHz), low leakage currents (5.8 × 10−11 A cm−2 at 20 kV cm−1), and a very high breakdown field of 5.5 MV cm−1. The results of this study suggest that aerosol‐deposited Ga2O3 layers have great potential to enable power switches with reliable switching.
Databáze: Directory of Open Access Journals
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