Smart protection system for identification and localisation of faults in multi-terminal DC microgrid

Autor: Rajeev Kumar Chauhan, Kalpana Chauhan
Jazyk: angličtina
Rok vydání: 2020
Předmět:
power distribution protection
power distribution faults
fault currents
short-circuit currents
distributed power generation
fault location
power generation faults
power generation protection
power generation reliability
power distribution reliability
electric sensing devices
electric current measurement
smart protection system
multiterminal dc microgrid
ac systems
high magnitude fault currents
dc link
protection scheme
low resistance earth fault
faulted section
ring main dc bus system
current sensors
dc bus segments
short-circuit current
fault location scheme
faults resistance
fault identification
fault localisation
distributed generation
entering current monitoring
outgoing current monitoring
insulated-gate bipolar transistors
circuit breakers
computer simulation
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Zdroj: IET Smart Grid (2020)
Druh dokumentu: article
ISSN: 2515-2947
DOI: 10.1049/iet-stg.2019.0315
Popis: DC microgrid provides the horizontal infrastructures to integrate distributed generation (DG) and loads. Unlike traditional AC systems, DC systems cannot survive or sustain high magnitude fault currents. It makes locating faults very difficult. The conventional protection techniques completely de-energies the DC link in the DC microgrid. A new protection scheme for multi-terminal DC microgrid against line-to-line fault and the low resistance earth fault is presented in this study. The scheme isolates the faulted section from the DC microgrid. Healthy sections are operated without any disturbance and supply continuity is maintained in a ring main DC bus system. The current sensors are mounted at DC bus segments to monitor the entering and outgoing current at different nodes. Further, the current sensors are also mounted at both ends of service mains to monitor their current difference at both ends of the service mains. The controller detects this current difference and opens circuit breakers. To meet the requirement of fast interrupting time and high short-circuit current withstanding capability, insulated-gate bipolar transistors used as circuit breakers. The fault location scheme gives the fault location in various sections (service mains) and faults resistance in the microgrid. The proposed concepts have been verified by computer simulation.
Databáze: Directory of Open Access Journals
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